THU PHYS
This instrument includes SPM and optical measurement system:
SPM system : AFM can offer oppurtunities of getting the sample morphology in nano-scale to apply for physical properties of varying materials. Therefore, applications of MFM, EFM, CAFM, and PFM appeared. SPM system offer many physical characterisitic informations of semiconductors, magnetic and ceramic materials.
Optical properties research : This system offers confocal laser images and combine Raman spectrum with analysis of physical and chemical properties.It also can use sapecial probes of SPM to intensify Raman spectrum informations and get many physical properties.
Specification：
1. Scanning range: 100x100x12um
2. Sample size up to 40×10 mm
3. Confocal microscope
| Space resolution: | 400 nm (Lens NA value:0.7) | |
| Laser wavelength: | 633 nm | |
| Wavelength resolution: | 0.025 nm (Grating 2400 lines/mm) | |
| Spectrum range: | 390 – 800 nm |
4. SPM laser wavelength: 800 nm